8160xx Family of Tunable Laser Sources

Introduction

The Keysight Technologies 8160xx Family of Tunable Laser Sources offers the full wavelength range from 1240 nm to 1650 nm with no wavelength gaps. All 8160xx Tunable Laser Sources are modules for the Keysight 8164B Lightwave Measurement System mainframe. This provides test instrumentation with maximum flexibility.

Investing in the Keysight 8160xx Family of Tunable Laser Sources can realize the cost efficiency and performance required to test components for coarse and dense wavelength division multiplexing (CWDM, DWDM, 100GBASE-LR4) and passive optical networks (PON).

Fast Two-Way Sweeps and High Power with Low SSE

The new Keysight 81606A top-line Tunable Laser Source has been designed to reach a new accuracy level and to increase test efficiency by enabling faster swept-wavelength tests and lower cost of ownership. It accelerates the automated adjustment of wavelength-selective devices in the new two-way sweep mode up to 200 nm/s speed with sub-picometer repeatability and best-in-class accuracy. With more than +12 dBm output power at the product family’s lowest spontaneous emission level, it enables the validation of extremely deep filters.

Through a major redesign, the new Keysight 81606A Tunable Laser Source reaches:

15 dB more dynamic range through high signal power at lowest spontaneous emission, enabled by the new cavity and laser module design.

A 4-fold improvement in absolute accuracy with increased real-time tracking speed and resolution, enabled by the novel wavelength reference unit.

Faster sweeps at up to 200 nm/s in both directions without impacting the specified dynamic accuracy, enabled by enhanced feedback controls and drive mechanics.

The new value and basic line models share the 81606A’s new design with low spontaneous emission and narrow line width, its industry-leading power repeatability and long-term stability. The new modules offer additional price-performance options based on output power, tuning speed, wavelength accuracy and repeatability. Whether you need to verify the design of demanding optical components or adjust more wavelength-selective switches per hour, or you simply need a stable, tunable optical source, the 8160xx family of tunable lasers offers a suitable model.

Certified quality

The 8160xx Family of Tunable Laser Sources are produced to the ISO 9001 international quality system standard as part of Keysight’s commitment to continually increasing customer satisfaction through improved quality control.

Specifications describe the instrument’s warranted performance. They are verified at the end of a 2-meter-long patchcord and are valid after warm-up, and for the stated output power and wavelength ranges.

Each specification is assured by thoroughly analyzing all measurement uncertainties. Supplementary performance characteristics describe the instrument’s non-warranted typical performance.

Every instrument is delivered with a commercial certificate of calibration and a detailed test report. For further details on specifications, refer to Chapter 3 in the Keysight 8160xx Series Tunable Laser Family User’s Guide (publication number 81606-90B01).

Keysight 8160xx Family of Tunable Laser Sources

The Keysight 8160xx tunable laser modules fit into the bottom slot of the Keysight 8164B Lightwave Measurement System mainframe.

The Keysight 81606A Top-Line Tunable Laser Source

The new 81606A Option 216 Tunable Laser Source is the new flagship model, featuring the widest tuning range of 200 nm, and an outstanding dynamic wavelength accuracy and repeatability. The excellent low-SSE performance of better than 80 dB/nm signal-to-source spontaneous emission ratio (signal-to-SSE ratio) and the high signal power permit measurements of wavelength isolation to 100 dB, most often limited by power meter sensitivity.

The Keysight 81607A, 81608A Value Line Tunable Laser

The new 81607A value line tunable laser source complements the top line 81606A model at a moderately reduced output power. With a typical wavelength repeatability of ±1 pm even during two-way sweeps with up to 200 nm/s, it is ideal for high-throughput test and automated adjustment of passive optical components.

The new 81608A, another member of the value line tunable laser sources, offers a peak output power of more than +12 dBm, at least 75 dB/nm above its spontaneous emission level. The 81608A features a typical wavelength repeatability of ±1.5 pm at two-way sweeps up to 200 nm/s. The laser’s balance of features, performance and price makes it suitable for both coherent transmission experiments and cost-effective manufacturing-floor component testing.

The Keysight 81609A Basic Line Step-Tunable Laser Source

The new 81609A basic line module can step within 300 milliseconds to discrete wavelengths with a resolution of 0.1 pm and a typical wavelength repeatability of ±3 pm, making it ideal for cost-effective testing of broadband optical devices. Like the other modules in the family, it delivers more than +12 dBm peak output power with low spontaneous emission levels. At ±0.01 dB power stability over an hour, it can also serve as a static local oscillator with a wide tuning range for receiver testing or transmission experiments.

Full wavelength range from 1240 nm to 1650 nm

The Keysight 8160xx Family of Tunable Laser Sources offers the full wavelength range from 1240 nm to 1650 nm with no wavelength gaps. The N7700A software suite has a measurement engine for IL and PDL that can combine the sweeps of up to 3 tunable laser wavelength ranges. Such a setup can be used for testing wideband multiplexers and PON devices.

Improved O-band models for Silicon Photonics applications

The new 8160xA option 113 covers the wavelength range from 1240 nm to 1380 nm for an important set of applications. Equipped with PMF output fiber, these are a good match for testing and developing components with Silicon Photonics technology. Verifying the spectral responsivity and the sensitivity of receiver optical subassemblies (ROSA) for 100G Ethernet benefit from more than +10 dBm output power - enough to allow for external modulation in BER testing. Combined with very low SSE levels, Option 113 is ideal for testing wavelength filters for LR4 components.

Integrated solutions for swept-wavelength spectral measurements

The 8160xx family is supported with the N7700A software suite for spectral measurements of insertion loss, polarization dependent loss and dispersion in combination with power meters and polarization instruments. These provide optimal swept-wavelength accuracy and dynamic range. See the N7700A brochure for details.