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LTE, LTE-Advanced FDD/TDD, LTE-V2X and NB-IoT/eMTC FDD X-Series Measurement App, Multi-Touch UI

Technical Overviews

LTE, LTE-Advanced FDD/TDD, LTE-V2X and NB-IoT/eMTC FDD X-Series Measurement App, Multi-Touch UI

LTE/LTE-Advanced FDD: N9080EM0E NB-IoT/eMTC FDD: N9080EM3E LTE/LTE-Advanced TDD: N9082EM0E LTE-V2X: N9080EM4E

– Perform LTE and LTE-Advanced FDD and TDD, LTE-V2X (aka Cellular V2X) and NB-IoT and eMTC FDD base station (eNB) and user equipment (UE) transmitter tests

– Accelerate measurements with one-button RF conformance tests as defined by 3GPP TS 36.141 and 36.521 specification

– Analyze carrier-aggregated signal of up to 5 contiguous/noncontiguous component carriers

– Pursue improved spectral efficiency with higher-order demodulation to 1024 QAM

– Use multi-touch interface and SCPI remote interface

– Flexible licensing provides the option of using perpetual or time based licenses with one or multiple signal analyzers

LTE, LTE-Advanced FDD/TDD, LTE-V2X and NB-IoT/eMTC FDD Measurement Applications  

The LTE, LTE-Advanced FDD/TDD, LTE-V2X and NB-IoT/eMTC FDD measurement applications transform the X-Series signal analyzers with multi-touch into standardsbased RF transmitter testers. The applications provide fast, one-button RF conformance measurements to help you design, evaluate, and manufacture your base stations (eNB) and user equipment (UE). The measurement applications closely follow the 3GPP standard, allowing you to stay on the leading edge of your design and manufacturing challenges.

X-Series measurement applications 

X-Series measurement applications increase the capability and functionality of Keysight Technologies, Inc. signal analyzers to speed time to insight. They provide essential measurements for specific tasks in general-purpose, cellular communications, wireless connectivity applications, covering established standards or modulation types. Applications are supported on both benchtop and modular, with the only difference being the level of performance achieved by the hardware you select.

X-Series measurement applications can help you:  

– Gain more insight into device performance with intuitive display and graphs for your application. Select from our library of over 25 different measurement applications.

– Ensure that your design meets the latest standard. Updates are made to the X-Series measurement applications as standards evolve.

– Apply the same measurement science across multiple hardware platforms for consistent measurement results over your design cycle from R&D to production.

– Choose the license structure that meets your business needs. We provide a range of license types (node-locked, transportable, floating or USB portable) and license terms (perpetual or time-based).

Top Features  

With the LTE/LTE-Advanced FDD and TDD measurement application, you can perform RF transmitter measurements on eNB and UE devices in time, frequency, and modulation domains. Measurement setups are simplified with automatic detection of downlink channels and signals. For eNB conformance testing, measurement is simplified by recalling E-TM presets according to 3GPP TS 36.141 specifications.

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