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N9068EM0E Phase Noise X-Series Measurement App with the Multi-Touch UI

Technical Overviews

N9068EM0E Phase Noise X-Series Measurement App with the Multi-Touch UI

  • Phase noise measurements with log plot and spot frequency views
  • Spectrum and IQ waveform monitoring for quick signal checks in frequency or time domain
  • Supports external mixing for measurements to 110 GHz and beyond
  • Multi-touch user interface or SCPI remote user interface
  • Built-in context-sensitive help
  • Flexible licensing provides the option of using perpetual or time-based licenses with one or multiple signal analyzers

Phase Noise Measurement Application  

Phase noise can be expressed as random, short-term frequency instability and is a key specification in both transmitter and receiver performance. For example, transmitting phase noise with digitally modulated signals leads to the spreading of symbols limiting the symbol rate. Phase noise in receiver local oscillators limits sensitivity by obscuring weak signals in LO phase noise sidebands. Keysight’s N9068EM0E phase noise measurement application for the UXA, PXA, MXA, EXA and CXA X-Series signal analyzers uses the direct spectrum method. This method measures single-sideband phase noise power in the signal analyzer. The application automatically configures and optimizes the analyzer’s settings, such as resolution bandwidth (RBW) and phase locked loops to achieve the highest measurement accuracy and speed.

X-Series measurement applications  

X-Series measurement applications increase the capability and functionality of Keysight Technologies, Inc. signal analyzers to speed time to insight. They provide essential measurements for specific tasks in general-purpose, cellular communications, wireless connectivity applications, covering established standards or modulation types. Applications are supported on both benchtop and modular, with the only difference being the level of performance achieved by the hardware you select.  

X-Series measurement applications can help you:  

  • Gain more insight into device performance with intuitive display and graphs for your application. Select from our library of over 25 different measurement applications.
  • Ensure that your design meets the latest standard. Updates are made to the X-Series measurement applications as standards evolve.
  • Apply the same measurement science across multiple hardware platforms for consistent measurement results over your design cycle from R&D to production.
  • Choose the license structure that meets your business needs. We provide a range of license types (node-locked, transportable, floating or USB portable) and license terms (perpetual or time-based).

Top Features  

Log Plot  

Log plot measures SSB phase noise (in dBc/Hz) versus offset frequencies expressed in logarithmic scale. This allows you to view the phase noise behavior of the signal under test across decades of offset frequencies in graphical and tabular form. Log plot rejects AM and PM noise in offsets up to half the bandwidth of the widest band digitizer, which can be up to a 1 GHz offset for the N9032B and N9042B. Using either noise rejection allows you to measure only the phase or the amplitude component of the noise. When measuring far offset phase noise measurements, the DANL performance of the analyzer dominates of its phase noise performance. Noise Floor Extensions (NFE) and overdrive in the Phase Noise Application can give a dramatic improvement in the measurement floor for wide-offset phase noise but can only be used for offsets greater than the AM/PM rejection settings.  

Automatic search of carrier function with Auto Tune Multi-level video filtering.  

  • Result trace hold with Off, Max hold or Min hold
  • Result trace filter On/ Off, if on you can specify the high cutoff frequency and slope, low cutoff frequency and slope

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