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IC-CAP Online Documentation Installation and Customization Guide User's Guide Reference Nonlinear Device Models Statistical Analysis Data Display Expressions
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What's New
Highlights (on the Web) of what is new in IC-CAP.
Release Notes
Latest information for the current release of IC-CAP.
Windows and UNIX installation, configuration, troubleshooting, and licensing information.
User's Guide
Creating models, macros, and graphic user interfaces, making measurements, and using transforms and functions. Includes information on simulating, optimizing, programming, managing data, printing and plotting.
Supported instruments, drivers, simulators, IC-CAP functions, Parameter Extraction Language (PEL), variables, and file structure.
Nonlinear Device Models, Volume 1
Characterization for the following models: UCB bipolar transistor, UCB MOSFET, BSIM3v3, BSIM4, UCB GaAs MESFET, Curtice GaAs MESFET, and MOS Model 9. In addition, using circuit modeling and the 1/f noise extraction toolkit.
Nonlinear Device Models, Volume 2
Using the following models: Agilent Root FET, High-Frequency FET (Curtice), High-Frequency BJT (Gummel-Poon), Agilent Root MOSFET, Agilent Root Diode, Agilent EEFET3/EEHEMT1, Agilent EEBJT2, Mextram, and VBIC. In addition, using IC-CAP with microwave and RF parameter extraction test systems.
Statistical Analysis
Using the IC-CAP Statistics package. Includes information on data analysis, data visualization, and file formats.
Data Display
Using the plotting, processing, and annotation features available for analyzing data.
Using the measurement functions to build expressions that process simulation results or the contents of a dataset. Includes general information on the structure and use of equations, along with an extensive function reference.
Links to printable PDF files for all IC-CAP documentation.
Links (on the Web) to journal articles on Agilent EEsof EDA products and applications.
Knowledge Center
Links (on the Web) to discussion forums, examples, software downloads, support documents, and tech info sessions.
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