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Pulse Analysis X-Series Measurement App, Multi-Touch UI Technical Overview

Technical Overviews

Pulse Analysis X-Series Measurement App, Multi-Touch UI

N9067EM0E  

– Automatically synchronize to pulse modulated signals for RADAR and Electronic Warfare (EW) applications up to 50 GHz and bandwidth of 1 GHz

– Verify all key pulse signal modulation performance indicators relating to power, droop, overshoot, ripple, time (rise/fall/width/PRI), frequency, phase, and FM modulation using the comprehensive pulse table result metrics

– Integrates with popular real-time instrument functionality (UXA, PXA, MXA) such as frequency mask trigger

– Capture and export PDW files for playback using Keysight signal generators

– Select from five X-Series signal analyzers with multi-touch to meet your specific design and test goals

– Use multi-touch front panel user interface or SCPI remote control

– Flexible licensing provides the option of using perpetual or time based licenses with one or multiple signal analyzers

– Import or capture reference pulses for pulse scoring and pulse compression measurements

Pulse Analysis Measurement Application  

The Keysight Technologies, Inc. N9067EM0E pulse analysis measurement application for multi-touch signal analyzers provides pulsed RADAR and EW analysis to characterize today’s dynamic signal environment. In mission-critical aerospace, defense and EW applications, signal design and validation require comprehensive tools for pulsed radar signal analysis and cross-domain - time, frequency and modulation - test capabilities. To help engineers achieve their design validation goals, the N9067EM0E, a powerful multi-touch application, integrates with the powerful multi-touch X-Series signal analyzers for comprehensive analysis and troubleshooting. The N9067EM0E populates a diverse set of pulse metrics in a flexible table format. All metrics, including pulse table results, result statistics, and cumulative statistics are easily saved into formats such as .csv for custom reports and post analysis.  

X-Series measurement applications  

X-Series measurement applications increase the capability and functionality of Keysight signal analyzers to speed time to insight. They provide essential measurements for specific tasks in general-purpose, cellular communications, wireless connectivity and digital video applications, covering established standards and modulation types. Applications are supported across X-Series signal analyzers, with the only difference being the level of performance achieved by the hardware you select.

X-Series measurement applications can help you:  

– Gain more insight into device performance with intuitive display and graphs for your application. Select from our library of over 25 different measurement applications.

– Ensure that your design meets the latest standard. Updates are made to the X-Series measurement applications as standards evolve.

– Apply the same measurement science across multiple hardware platforms for consistent measurement results over your design cycle from R&D to production.

– Choose the license structure that meets your business needs. We provide a range of license types (node-locked, transportable, floating or USB portable) and license terms (perpetual or time-based).

Top Features  

– Verify all key pulse signal modulation performance indicators relating to power, droop, overshoot, ripple, time (rise/fall/width/PRI), frequency and phase, using the comprehensive pulse table result metrics

– Visualize pulse signal modulation characteristics and impairment errors in detail with multiple time-synchronized amplitude, phase, and frequency (FM) trace results, in addition to flexible trace overlay support

– Quickly view statistical variance performance data for each reported pulse metric, accumulated over single or multiple acquisitions, using the pulse cumulative statistics table, graphical histogram, and trend line trace plots

– Gain deeper insights into your signal’s time and frequency domain dynamic and spurious performance with powerful and flexible trace views such as spectrogram and cumulative history

– Create and export PDW tables for incoming signals

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