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N1055A 35/50 GHz 2/4 Port TDR/TDT Remote Sampling Head for the DCA-X - TE

Technical Overviews

N1055A Remote Head Module

35/50 GHz 2/4 Port TDR/TDT For the DCA-X Series Oscilloscope Mainframe

Engineered for easy, accurate impedance and S-parameter measurements on multi-port 10/25/28 Gbps (40 Gb/100 Gb) designs

  • Highest resolution TDR/TDT measurements
  • Fast and accurate multiport S-parameters, up to 16 ports
  • World’s easiest-to-use solution

Signal Integrity Challenges Abound

As new digital designs increase in data rates to 28 Gb/s and beyond, signal integrity issues become more challenging. Additionally, industry standards such as IEEE 802.3 ba/bj/ bm (40 Gb/100 Gb Ethernet), Optical Inter-networking Forum (OIF) CEI 3.0, Fibre channel, PCI Express, USB, and InfiniBand require the use of TDR/TDT and S-parameter measurements to ensure compliance and system interoperability.

A fully-integrated TDR/TDT/S-parameter measurement system

Designed for both novice and expert users alike, the Keysight Technologies, Inc. N1055A remote head module provides time-domain reflectometry and transmission (TDR/TDT) capability for the DCA-X oscilloscope platform, providing fast and accurate impedance and S-parameter measurements on high-speed designs that have up to 16 ports. The DCA-X oscilloscope mainframe can be configured with one to four N1055A TDR/TDT plug-in modules to provide a 2- to 16-channel TDR/TDT measurement system that is both economical and accurate. The 2/4 port TDR/TDT remote heads can be configured with sampler bandwidth of 35 GHz or 50 GHz, providing single-ended and differential measurement capability including True-Mode stimulus functionality.

Measurements include:

Time-Domain Reflectometry (TDR)

  • Impedance measurements
  • Locate the position and nature of each discontinuity
  • Propagation/time delay
  • Excess reactance (capacitance or inductance)
  • Effective dielectric constant
  • Time-Domain Transmission (TDT)
  • Step response
  • Propagation/time delay
  • Propagation velocity
  • Rise-time degradation
  • Near-end crosstalk (NEXT)
  • Far-end crosstalk (FEXT)
  • Skew

TDR Fixture De-Embedding

Standard in FlexDCA software revision A.05.30.xx and newer, TDR fixture de-embedding enables you to remove the effects of fixtures, cables or probes connected between the remote heads and DUT. All you need is the S-parameter file for the device you want to de-embed. Flex DCA supports both 2-port and 4-port fixtures, and you can use multiple fixtures on DUTs up to 16 ports (fixtures cannot be connected together in series). With FlexDCA, it is simple to re-assign the port order of the fixtures to de-embed, making it easy for you to use an S-parameter file created on any instrument. Using the same fixture, cable or probe on both the input and output of your DUT? FlexDCA makes it simple to reverse a fixture connected to any DUT port in the de-embed setup.

Automatic Fixture Removal (N1010300A) 

When measuring physical layer devices with non-coaxial interfaces, test fixtures or probes are often used to connect the device under test (DUT) to the measurement equipment. For accurate measurements of the DUT, the fixtures or probes need to be characterized and their effects removed from the composite measurement of the DUT plus test fixture or probe combination.

Modern TDR and VNA instruments have built-in de-embedding capabilities that enable the user to remove the effects of fixtures and probes from the measurement. Those de-embedding capabilities depend on the user having accurate characterization data, typically a touchstone file, for the fixture or probe to be de-embedded.

Since these fixtures or probes typically have non-coaxial interfaces on some ports, it is difficult to measure them directly.

One-port AFR

Many of the fixtures and probes used today have connectors on one port and non-coaxial interfaces on the other port, making them perfect candidates for characterization using one-port AFR. One-port AFR requires the user to measure the probe or fixture from the connectorized port with the other port open and/or shorted. AFR then mathematically extracts the fixture or probe S-parameters from the open or short measurement (or both). That S-parameter file can then be used to de-embed the fixture using the standard TDR or VNA instrument de-embedding capabilities. 

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